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SurfaceTechnology GERMANY, 16 - 18 June 2020
Homepage>Exhibitors & Products >Analysis with the Scanning Electron Microscope (SEM)

Analysis with the Scanning Electron Microscope (SEM)

Logo Analysis with the Scanning Electron Microscope (SEM)

Product description

For the characterisation of pickled surfaces for plastic- galvanising the SEM analysis is the only suitable method up to now. The IGOS- Team has experience in conducting these analyses and in the interpretation of the results.

Hall 1, Stand D27, (31)

Welt der Oberfläche

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