SurfaceTechnology GERMANY, 21 - 23 Juni 2022
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Low Resistivity Measurement System

für den niederohmigen Bereich. Schnell und Akurat

Logo N&H Technology


N&H Technology

Exhibitor details
Exhibitor details
Logo Low Resistivity Measurement System
Logo Low Resistivity Measurement System

Product description

LORESTA-GX has a expanded measuring range of 10-4
107 Ohm.

The probe enables one-touch direct reading of surface resistivity. It has a special silicon mode for silicon wafer measurement and one-touch automatic measurement by new functions like Auto-Hold and Timer Mode. The accurate low resistivity meter based on 4 Terminal 4 Pin method. It ensures a high accuracy by MCP probes spring contact method which keeps pin pitch, pressure adn contact area on samples constant.

Product website

Hall 1, Stand B53

(Main stand)

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