27 - 29 October 2020
Hitachi High-Tech Analytical Science
Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table.With superior resolution, high efficiency SDD and SmartLink software, the MAXXI 6 is the ideal instrument for measuring the thinnest coatings and element composition at trace Level.
The updated imaging system, new automatic measurement positioning functionality and a large sample table makes this benchtop coatings analyser easy to use, increasing ...
Designed to address the challenge of ultra-thin coatings, such as found in todays shrinking electronic components, the FT150 produces fast, accurate and repeatable ...
Our handheld XRF Analyzer, the X-MET8000, delivers the speed and performance required even in the most demanding applications, by using the optimised combination ...
These reliable, accurate and easy-to-use tools service a number of industries including PCB assembly and manufacturing for both surface mount and plated thru-hole ...