ORDER ANALYTICS
Surface analysis – Precise insights down to the atomic level
We offer high-resolution, quantitative and chemically sensitive analyses of surfaces, interfaces and thin layers using the following methods:
- XPS (X-ray photoelectron spectroscopy)
Identify and quantify chemical elements and bonding states on the sample surface – ideal for material characterisation, defect analysis or quality assurance on a nanometre scale.
- AES (Auger electron spectroscopy)
Use this method for high-resolution element distribution in near-surface areas – particularly effective for analysing metals, alloys and microstructured materials.
- TOF-SIMS (time-of-flight secondary ion mass spectrometry)
Obtain molecular and isotopic information with the highest lateral resolution – ideal for depth profiling, imaging analysis and contamination detection.
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